Self-Organizing Maps for Competitive Technical Intelligence Analysis

Authors

  • Lu An nformation Management School, Wuhan University, Luojia Shan, Wuhan 430072, China
  • Chuanming Yu School of Information and Safety Engineering, Zhongnan University of Economics and Law, #1, South Nanhu Road, Wuhan 430073, China

Keywords:

Self-Organizing Map, Attribute Variance Matrix, Competitive technical intelligence, Cell phone

Abstract

This study examines how the Self-Organizing Map (SOM) technique can be used to identify key competitors and determine key technical attributes of electronic products. A novel SOM display named Attribute Variance Matrix (AV-Matrix) was presented and applied to the background colors of the corresponding SOM nodes. The cell phone industry was selected as the example and a certain number of cell phones and their technical attribute data were collected and trained by the SOM algorithm. The cell phone SOM display was projected into the space constructed by the key technical attributes and the advantages and disadvantages of competitors were explored.

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Published

2012-01-01

How to Cite

Lu An, & Chuanming Yu. (2012). Self-Organizing Maps for Competitive Technical Intelligence Analysis. International Journal of Computer Information Systems and Industrial Management Applications, 4, 9. Retrieved from https://cspub-ijcisim.org/index.php/ijcisim/article/view/153

Issue

Section

Original Articles