Bayesian-Optimized Hybrid Random Forest and Feature Attention-Based Residual Neural Network for Software Defect Prediction

Authors

  • Dinesh Kumar Department of Computer Science and Applications, Om Sterling Global University, Hisar, India.
  • Saurabh Charaya School of Engineering and Technology, Om Sterling Global University, Hisar, India.

DOI:

https://doi.org/10.70917/ijcisim-2026-3588

Keywords:

Software Reliability, Bayesian Optimization, ANN, Support Vector Machine, Random Forest, Residual ANN, SMOTE, Feature Attention, Stratified Cross-Validation

Abstract

Software defect prediction is an important activity used for identifying fault-prone modules at an early stage of software development. It is used for enhancing software reliability and reducing maintenance costs. Traditional software defect prediction machine learning(ML) models perform well but often fail to capture complex nonlinear relationships in software metrics. Deep learning(DL) models address this limitation by learning hierarchical features but can still be hindered by class imbalance, poor hyperparameter tuning, and insufficient attention to feature importance. To address these challenges, this paper proposes a hybrid software defect prediction model (RF-FA-ResANN) that integrates Random Forest with a Feature Attention-based Residual Artificial Neural Network. This model is evaluated using Stratified 5-Fold Cross-Validation with Accuracy, Precision, Recall, F1-score, and ROC-AUC as performance metrics. Experimental results demonstrate that this model achieved accuracies of 99.83% and 90.29%, F1- scores of 99.15% and 87.1%, with ROC-AUC scores of 0.99998 and 0.94448 on software_defect and NASA JM1 datasets respectively. Experimental results show that proposed RF-FA-ResANN model outperformed conventional Machine Learning models (Support Vector Machine, Naïve Bayes, and Random Forest) as well as Deep Learning models (ANN, Attention-based ANN, Residual ANN, and Attention-based Residual ANN). This model integrates ensemble learning, feature attention, residual learning, and Bayesian optimization, which improves robustness and accuracy in software defect prediction.

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Published

2026-07-24

How to Cite

Dinesh Kumar, & Saurabh Charaya. (2026). Bayesian-Optimized Hybrid Random Forest and Feature Attention-Based Residual Neural Network for Software Defect Prediction. International Journal of Computer Information Systems and Industrial Management Applications, 18(10s), 333–355. https://doi.org/10.70917/ijcisim-2026-3588

Issue

Section

Original Articles