Pallavee Pravin Bavane et al. 2026. Deep Learning Techniques for Plant and Soybean Leaf Disease Detection: A Review of Models, Datasets, Gaps, Challenges and Future Directions. International Journal of Computer Information Systems and Industrial Management Applications. 18, 4s (Jun. 2026), 754–770. DOI:https://doi.org/10.70917/ijcisim-2026-2564.