ANU BAJAJ; KRISH UPPAL; RHEANCA RAZDAN; YESSICA TUTEJA; ANKIT BHARDWAJ; AJITH ABRAHAM. A Comprehensive Analysis for Dark Pattern Detection Using Structural, Visual and Textual Information . International Journal of Computer Information Systems and Industrial Management Applications, [S. l.], v. 17, p. 12, 2025. DOI: 10.70917/ijcisim-2025-0002. Disponível em: https://cspub-ijcisim.org/index.php/ijcisim/article/view/1013. Acesso em: 19 feb. 2025.