XIAOYAN XU; JENNIFER C. DELA CRUZ. PCB Surface Defect Detection Algorithm Based on Multi-Scale Feature Enhancement and Lightweight. International Journal of Computer Information Systems and Industrial Management Applications, [S. l.], v. 17, p. 20, 2025. DOI: 10.70917/ijcisim-2025-0184. Disponível em: https://cspub-ijcisim.org/index.php/ijcisim/article/view/1398. Acesso em: 30 apr. 2026.