PALLAVEE PRAVIN BAVANE; PADMA DANDANNAVAR; SACHIN SUBHASH PATIL. Deep Learning Techniques for Plant and Soybean Leaf Disease Detection: A Review of Models, Datasets, Gaps, Challenges and Future Directions. International Journal of Computer Information Systems and Industrial Management Applications, [S. l.], v. 18, n. 4s, p. 754–770, 2026. DOI: 10.70917/ijcisim-2026-2564. Disponível em: https://cspub-ijcisim.org/index.php/ijcisim/article/view/2564. Acesso em: 1 jul. 2026.