SURBHI TANDON; NAVNEET KAUR. Dual Stacking for Rapid Crop Yield Prediction Using LSTM-Based Analytical Deep Learning. International Journal of Computer Information Systems and Industrial Management Applications, [S. l.], v. 18, n. 23s, p. 48–60, 2026. DOI: 10.70917/ijcisim-2026-5553. Disponível em: https://cspub-ijcisim.org/index.php/ijcisim/article/view/5553. Acesso em: 10 sep. 2026.