Pallavee Pravin Bavane, Padma Dandannavar, and Sachin Subhash Patil. 2026. “Deep Learning Techniques for Plant and Soybean Leaf Disease Detection: A Review of Models, Datasets, Gaps, Challenges and Future Directions”. International Journal of Computer Information Systems and Industrial Management Applications 18 (4s):754-70. https://doi.org/10.70917/ijcisim-2026-2564.