Anu Bajaj, Krish Uppal, Rheanca Razdan, Yessica Tuteja, Ankit Bhardwaj, and Ajith Abraham. “A Comprehensive Analysis for Dark Pattern Detection Using Structural, Visual and Textual Information ”. International Journal of Computer Information Systems and Industrial Management Applications 17 (January 6, 2025): 12. Accessed May 5, 2026. https://cspub-ijcisim.org/index.php/ijcisim/article/view/1013.