1.
Utkarshkumar Shah. Firmware-Controlled Precision Edge Ring Positioning for Improved Wafer-Level Etch Uniformity in Plasma Etch Semiconductor Equipment. IJCISIM [Internet]. 2026 Jul. 8 [cited 2026 Jul. 10];18(6s):196-204. Available from: https://cspub-ijcisim.org/index.php/ijcisim/article/view/2879